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3rd International Conference “Research and Innovation on Products” (Opportunity of Skill India Products)

Sri Bhargav Krishna Adusumilli, Prof. Bashiru Aremu, Dr. R.K. Abhilashi, Prof. (Dr.) Reena Singh, Prof. (Dr.) Vandana Singh
Type: Print Book
Genre: Reference, Science & Technology
Language: English
Price: ₹1,100
Price: ₹1,100
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Description

The emergence of advanced manufacturing techniques has driven the need for sophisticated quality assurance and control mechanisms in the production of machined metal parts. Residual stresses, which are stress distributions that remain in a material after the original cause of the stresses has been removed, are a critical concern in the machining industry. These stresses can significantly influence the mechanical properties, performance, and longevity of metal components. Traditionally, methods for detecting and analyzing residual stress have been invasive, time-consuming, and require bulky equipment. However, with the advent of artificial intelligence (AI) and advancements in sensor technology, there is a transformative shift towards the development of portable, non-invasive, and efficient residual stress detectors.

About the Authors

Sri Bhargav Krishna Adusumilli, Prof. Bashiru Aremu, Dr. R.K. Abhilashi, Prof. (Dr.) Reena Singh, Prof. (Dr.) Vandana Singh

Book Details

ISBN: 9788197783326
Publisher: Springer-GEH Press
Number of Pages: 493
Dimensions: 8"x11"
Interior Pages: B&W
Binding: Paperback (Perfect Binding)
Availability: In Stock (Print on Demand)

Ratings & Reviews

3rd International Conference “Research and Innovation on Products” (Opportunity of Skill India Products)

3rd International Conference “Research and Innovation on Products” (Opportunity of Skill India Products)

(5.00 out of 5)

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2 Customer Reviews

Showing 2 out of 2
Jaidev Kumar 1 month, 2 weeks ago

Dr. Jaidev Dr. Tusar

Both authors give a useful knowledgeable ideas which are ideal for all researcher as well as students

tusar.bajpai 1 month, 2 weeks ago Verified Buyer

Dr.Tusar Bajpai,Dr.Jaidev

Nice collection of International conference
Many papers are very useful for further information

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